Magnetic & Structural Characterization

Measurement and analysis of magnetic and nanoscale properties using PPMS, VNA, AFM/MFM, XRD, and related instruments. Many of the PPMS measurements were done at low temperature (sub 2 K).

Different project goals were involved characterization of magnetic and structural properties of materials using:

  • PPMS Measurements: Magnetic (VSM), ferromagnetic resonance (FMR), electrical transport (ETO), Hall Measurement and current-dependent measurements using Keithley 6221 and NV 2182.
  • RF & VNA Measurements: Frequency vs. magnetic field S21 characterization using Vector Network Analyzer (VNA).
  • Lock-In Amplifier & RF Generator: Signal detection and excitation for magnetic and transport experiments.
  • Structural & Surface Analysis: X-Ray Diffraction (XRD) for crystal structure, Atomic & Magnetic Force Microscopy (AFM/MFM) for topography and magnetic domain imaging.
Electrical transport measurement setup using the PPMS system.
Reprinted with permission from M. Mahdi et al., IEEE Trans. Appl. Supercond., vol. 35, no. 5, Aug 2025. © IEEE.
Measurement setup for VNA–PPMS experiments
Measurement setup for vector network analyzer (VNA) and PPMS experiments.
Reprinted with permission from M. Mahdi et al., IEEE Trans. Appl. Supercond., vol. 35, no. 5, Aug 2025. © IEEE.
Measurement results
Measurements done with QD-PPMS cryostat: (a) Anomalous Hall Effect Measurement, (b) Corresponding Hall resistance, and (c) Coercivity.
These results for CrTe2 sample I presented at MMM-Intermag 2022 Conference .

These measurements enabled quantitative analysis of magnetic, electrical, and structural properties at the nanoscale, facilitating material optimization and device performance evaluation.